The Jitter-Noise Duality and Anatomy of an Eye Diagram

Oct 25, 2026

Uploaded by Aran

The Jitter-Noise Duality and Anatomy of an Eye Diagram compares two ways of interpreting eye-diagram structure: as timing uncertainty or as vertical (voltage) uncertainty. The work shows that accurate BER evaluation under serious eye impairment requires the vertical-uncertainty view, consistent with BER definition and delay-lock-loop logic via separated integration of eye portions. Jitter-induced vertical noise is treated similarly to ISI as a correlated contribution, enabling simple statistical simulation using probability mass functions for joint Tx jitter and ISI effects.

LanguageEnglish

CategoryTechnology

FormatPDF

Pages29

Reading Time1 h 13 min

AccessFree to download

Abstract

Patent Disclosure

Biography

Dr. Vladimir Dmitriev-Zdorov

Dr. Martin Miller

Chuck Ferry

Introduction

Jitter vs. vertical uncertainty for BER

ISI, noise, and eye-diagram interpretation

BER evaluation via vertical integration

DesignCon 2014 The Jitter-Noise Duality and Anatomy of an Eye Diagram Vladimir Dmitriev-Zdorov, Mentor Graphics [vladimir_dmitriev-zdorov@mentor.com](vladimir_dmitriev-zdorov@mentor.com) Martin T. Miller, Teledyne LeCroy [marty.miller@teledynelecroy.com](marty.miller@teledynelecroy.com) Chuck Ferry, Mentor Graphics [chuck_ferry@mentor.com](chuck_ferry@mentor.com) Abstract We compare two approaches where the structure of the eye diagram is considered either as a timing uncertainty or alternatively a vertical uncertainty. We show that only the second view allows accurate BER evaluation when the eye is seriously impaired. It follows from BER definition that its proper evaluation should bedelay lock loop based on considering the two portions of the eye diagram, and by their separate integration. With such understanding of BER, it turns out that the jitter-induced vertical noise can be considered same way as the signal’s ISI, although correlated with the latter. We propose a method of statistical simulation based on this view, where the effect of Tx jitter and ISI is considered together. We use the probability mass functions (PMF) to represent both ISI and jitter contributions, which makes the algorithm simple and physically clear. Some interesting effects can be explained based on the proposed approach, for example jitter increase with growing PRBS order of the input pattern. Patent Disclosure Portions ofthis document are the subject of patents applied for. Biography Dr. Vladimir Dmitriev-Zdorov is a principal engineer at Mentor Graphics Corporation. He developed a number of advanced models and novel simulation methods used in the company’s products. Current work includes development of the efficient methods of circuit/system simulation in time and frequency domain, transformation and analysis of the multi-port systems, statistical & time domain analysis ofSERDES links. He received Ph.D. and D.Sc. degrees (1986, 1998) based on his work on circuit and system simulation methods. The results have been published in numerous papers, conference proceedings, including several in DesignCon, and a monograph. Dr. Martin Miller is chief scientist at Teledyne-LeCroy. Marty received a doctorate in particle physics from the University of Rochester (1981) . He has over 35 years experience at Teledyne-LeCroy in various R&D functions, including analog, digital and software design. Marty has spent the past 24 years focusing on algorithms and methods for display and measurements in digital oscilloscopes, most significantly in the area of signal integrity (jitter and timing) . Presently he has more than 15 U.S. patents in this domain. He has participated in IEEE committees and JEDEC, contributing to test methods for digitizers and memories. He has actively participated in DesignCon since 2007 as both an “expert” panel member (tp_M1), as a paper presenter, tutorial presenter and is on the program committee for DesignCon. Chuck Ferry is product marketing manager at Mentor Graphics Corporation. Chuck focuses on product definition and validation for signal integrity and power integrity solutions. He has spent the last 15 years tackling a broad range of high speed digital design challenges spanning from system level design to multi-gigabit channel analysis developing and incorporating detailed characterizations ofthe IC, packages, connectors and multiple boards. He has delivered signal integrity services and seminars using a wide range of EDA tools as well as performed modeling services creating and validating IC models. Chuck graduated Magna cum Laude from the University of Alabama with a BS in electrical engineering and continued graduate course work in the areas of signal processing and hardware description languages. Introduction IS ”JITTER” PURELY TIMING UNCERTAINTY or the consequence of vertical uncertainty (i.e. voltage noise) or is noise the consequence of jitter? Which view is more productive for an accurate estimati

FAQs

What two approaches does the document compare for eye-diagram interpretation?

It compares viewing eye-diagram structure as timing uncertainty versus viewing it as vertical uncertainty (voltage noise).

Why does the vertical-uncertainty view enable accurate BER evaluation when the eye is impaired?

Because proper BER evaluation follows BER definition and requires delay-lock-loop considerations using separate integration of eye portions, which aligns with vertical integration of eye density or histogram.

How are jitter-induced vertical noise and ISI treated in the proposed simulation method?

The method treats jitter-induced vertical noise similarly to the signal’s ISI, while noting they are correlated. It uses probability mass functions to represent both contributions and simulates their joint effect from Tx jitter and ISI.

Oct 25, 2026

Uploaded by Aran