A STUDY OF TRAPS IN THE METAL-INSULATOR-SEMICONDUCTOR (MIS) SYSTEM WITH THE THREE TERMINAL GATED-DIODE STRUCTURE - Abstract

Sep 2, 2026

A dissertation focused on studying traps in the metal-insulator-semiconductor (MIS) system using a three-terminal gated-diode structure. The work frames the research as a Ph.D. dissertation at Lehigh University (Electrical Engineering) in 1984, with formal acceptance for the Doctor of Philosophy degree. It includes acknowledgments to academic advisors and contributors, and notes support from the National Science Foundation, Fairchild Foundation, and Hewlett-Packard Design Aids Program.

LanguageEnglish

CategoryResearch & Report

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Pages232

Reading Time9 h 45 min

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A STUDY OF TRAPS IN THE METAL-INSULATOR-SEMICONDUCTOR (MIS) SYSTEM WITH THE THREE TERMINAL GATED-DIODE STRUCTURE

Dissertation identification

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The Preserve:Lehigh Library Digital Collections A Study Of Traps In TheMetal-insulator-Semiconductor(mis)System With The ThreeTerminal Gated-diode Structure(devices,Mos,Microelectronics). Citation AGARWAL,ANANT KUMAR.A Study Of Traps In The Metal-Insulator -Semicon- ductor (mis)System With The Three Terminal Gated-Diode Structure(devices,Mos, Microelectronics).1984,https://preserve.lehigh.edu/lehigh-scholarship/gradu ate-publications-theses-dissertations/theses-dissertations/study-traps. This document is brought to you for free and open access by Lehigh Preserve.It has been accepted forinclusion by an authorized administrator of Lehigh Preserve.For more information,please contactpreserve@lehigh.edu. # INFORMATION TO USERS This reproduction was made from a copy of a document sent to us for microfilming.While the most advanced technology has been used to photograph and reproducethis document,the quality of the reproduction is heavily dependent upon thequality of the material submitted. The following explanation of techniques is provided to help clarify markings ornotations which may appear on this reproduction. 1.The sign or “target”for pages apparently lacking from the documentphotographed is “Missing Page(s)”.If it was possible to obtain the missingpage(s)or section,they are spliced into the film along with adjacent pages.Thismay have necessitated cutting through an image and duplicating adjacent pagesto assure complete continuity. 2.When an image on the film is obliterated with a round black mark,it is anindication of either blurred copy because of movement during exposure,duplicate copy,or copyrighted materials that should not have been filmed.Forblurred pages,a good image of the page can be found in the adjacent frame.Ifcopyrighted materials were deleted,a target note will appear listing the pages inthe adjacent frame. 3.When a map,drawing or chart,etc.,is part of the material being photographed,a definite method of “sectioning”the material has been followed.It iscustomary to begin filming at the upper left hand corner of a large sheet and tocontinue from left to right in equal sections with small overlaps.If necessary,sectioning is continued again-beginning below the first row and continuing onuntil complete. 4.For illustrations that cannot be satisfactorily reproduced by xerographicmeans,photographic prints can be purchased at additional cost and insertedinto your xerographic copy.These prints are available upon request from theDissertations Customer Services Department. 5.Some pages in any document may have indistinct print.In allcases the bestavailable copy has been filmed. University Microfilms International 300 N.Zeeb Road Ann Arbor,MI48106 # A STUDY OF TRAPS IN THE METAL·INSULATOR-SEMICONDUCTOR(MIS) SYSTEM WITH THE THREE TERMINAL GATED-DIODE STRUCTURE Lehigh University PH.D.1984 UniversityMicrofilmsInternational 300N.Zeeb Road,Ann Arbor,M₁48106 ## PLEASE NOTE: In all cases this material has been filmed in the best possible way from the available copy.Problems encountered with this document have been identified here with a check mark √ 1.Glossy photographs or pages 2.Colored illustrations,paper or print √ 3. Photographs with dark background. 4. ustrations are poor copy. 5. Pages with black marks,not original copy. 6. Print shows through as there is text on both sides of page. 7. Indistinct,broken or small print on several pages.V 8. Print exceeds margin requirements. 9. Tightly bound copy with print lost in spine. 10. Computer printout pages with indistinct print. 11. Page(s). lacking when material received,and not available from school orauthor. 12. Page(s) seem to be missing in numbering only as text follows. 13. Two pages numbered. .Text follows. 14. Curling and wrinkled pages. 15. Other

FAQs

What topic does the dissertation address?

It investigates traps in the metal-insulator-semiconductor (MIS) system using a three-terminal gated-diode structure.

Where and for what degree was the dissertation submitted?

It was submitted to Lehigh University for the Doctor of Philosophy degree in Electrical Engineering.

Who are the people acknowledged, and what support is mentioned?

The dissertation acknowledges multiple professors, committee members, and contributors, and states that the work was supported by grants from the National Science Foundation, Fairchild Foundation, and Hewlett-Packard Design Aids Program.

Sep 2, 2026

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