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This tutorial supports first-time XRD measurements by introducing diffraction principles, describing the instrument, and outlining essential scan types including θ-2θ scans, grazing-incidence scans, rocking curves, pole figures, and azimuth (ϕ) scans. It provides guidance on optics, sample mounting, alignment, scan condition selection, and introduces basic data analysis and data presentation recommendations to make meaningful XRD analysis accessible for newcomers.",{"@graph":63,"@context":118},[64,80,101],{"@type":65,"itemListElement":66},"BreadcrumbList",[67,71,74,77],{"item":68,"name":69,"@type":70,"position":9},"https://docshare.wps.com","Home","ListItem",{"item":72,"name":10,"@type":70,"position":73},"https://docshare.wps.com/template/",2,{"item":75,"name":11,"@type":70,"position":76},"https://docshare.wps.com/template/presentations/",3,{"item":78,"name":59,"@type":70,"position":79},"https://docshare.wps.com/template/back-to-basics-tutorial-x-ray-diffraction-of-thin-films/565420/",4,{"url":78,"name":59,"@type":81,"image":82,"author":87,"headline":59,"publisher":90,"fileFormat":93,"inLanguage":57,"description":61,"dateModified":94,"datePublished":95,"encodingFormat":93,"isAccessibleForFree":96,"interactionStatistic":97},"DigitalDocument",{"url":83,"@type":84,"width":85,"height":86},"https://docshare.wps.com/thumbnails/back-to-basics-tutorial-x-ray-diffraction-of-thin-films/565420.png","ImageObject",442,249,{"name":88,"@type":89},"Chumphorn","Person",{"url":68,"name":91,"@type":92},"DocShare","Organization","application/pdf","2026-10-23","2026-10-13",true,{"@type":98,"interactionType":99,"userInteractionCount":79},"InteractionCounter",{"@type":100},"ViewAction",{"@type":102,"mainEntity":103},"FAQPage",[104,110,114],{"name":105,"@type":106,"acceptedAnswer":107},"What is the main purpose of this Back-to-Basics XRD tutorial?","Question",{"text":108,"@type":109},"To lower the barrier for researchers performing meaningful XRD analysis and to make the literature more accessible for more advanced XRD investigations.","Answer",{"name":111,"@type":106,"acceptedAnswer":112},"Which XRD measurement types are highlighted as essential for thin-film characterization?",{"text":113,"@type":109},"The tutorial introduces five types: θ-2θ scans, grazing-incidence scans, rocking curves, pole figures, and azimuth (ϕ) scans.",{"name":115,"@type":106,"acceptedAnswer":116},"What practical aspects are covered to help beginners run effective XRD measurements?",{"text":117,"@type":109},"It gives guidelines for selecting appropriate optics, mounting and aligning the sample, choosing scan conditions, and recommends how to present data.","https://schema.org",{"og:url":78,"og:type":120,"og:title":59,"og:site_name":91,"og:description":61},"article",{"robots":122,"canonical":78},"index,follow",{"doc_id":124,"site_id":56},565420,1792360288,{"code":4,"msg":5,"data":127},{"doc_id":124,"user_id":128,"nickname":88,"user_avatar":129,"doc_module":9,"category_id":8,"category_name":11,"doc_title":59,"doc_description":61,"doc_content":130,"file_id":131,"file_url":132,"file_type":133,"file_size":134,"view_count":79,"is_deleted":4,"is_public":9,"is_downloadable":9,"audit_status":9,"page_count":135,"language":136,"language_code":57,"site_id":56,"html_lang":57,"table_of_contents":137,"faqs":138,"seo_title":139,"seo_description":61,"update_tm":140,"read_time":141},2336475401981,"https://ap-avatar.wpscdn.com/avatar/22000c94efd8d5204d?x-image-process=image/resize,m_fixed,w_180,h_180&k=1786935347598174694","Journal of Electroceramics (2021) 47:141–163  \n[https://doi.org/10.1007/s10832-021-00263-6](https://doi.org/10.1007/s10832-021-00263-6)  \nBack‑to‑Basics tutorial: X‑ray diffraction of thin films  \nGeorge F. Harrington1,2,3,4 · José Santiso5  \nReceived: 30 April 2021 / Accepted: 5 August 2021 / Published online: 13 October 2021  \n© The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2021  \nAbstract  \nX-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well asthe interpretation of the resultant patterns and scans. In this tutorial article, we provide a foundation for the thin-film engineer/scientist conducting their first measurements using XRD. We give a brief introduction of the principle of diffraction and description of the instrument, detailing the relevant operation modes. Next, we introduce five types of measurements essential for thin film characterisation: ∕􀀞 scans, grazing-incidence scans, rocking curves, pole figures, and azimuth scans (or ϕ scans) . Practical guidelines for selecting the appropriate optics, mounting and aligning the sample, and selecting scan conditions are given. Finally, we discuss some of the basics of data analysis, and give recommendations on the presentation of data. The aim of this article is to ultimately lower the barrier for researchers to perform meaningful XRD analysis, and, building on this foundation, find the existing literature more accessible, enabling more advanced XRD investigations.  \nKeywords X-ray diffraction · Thin films · Methodology · Tutorial · Guidelines · Back-to-Basics  \nPart of the Back-to-Basics Tutorial Series:  \nIn this Back-to-Basics ar􀀖cle series, we aim to lower the entrance barrier for researchers carrying out measurements in a given technique for the first 􀀖me by establishing a series of tutorials, each on a specific experimental technique or method applied to electroceramic materials. Each ar􀀖cle will impart a basic understanding and provide prac􀀖cal guidelines for the beginner. Through the Back-to-Basics series, we hope to collec􀀖vely gather the community’s experience on experimental research in a way that will ul􀀖mately serve the needs of as broad as audience as possible.  \n1 Introduction  \nThin films are excellent model systems to study electroceramic materials. Possessing a well-defined geometry and a  \n* George F. Harrington [harrington@pc.rwth-aachen.de](harrington@pc.rwth-aachen.de)  \n1 Center of Coevolutionary Research for Sustainable Communities (C2RSC), Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan  \n2 Next-Generation Fuel Cell Research Centre, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan  \n3 Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA 02139, USA  \nmicrostructure that can be tailored via fabrication or posttreatment conditions, thin films represent an indispensable approach to investigate interfacial, microstructural, or confinement effects in oxides. More complex thin film structures can also be engineered, such as multilayers, nanocomposite films, layers with a graded composition, and ultimately superlattices. Direct technological applications of oxide  \n4 International Institute for Carbon-Neutral Energy Research (I2CNER), Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan  \n5 Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and Barcelona Institute of Science and Technology (BIST), Campus UAB, 08193 Bellaterra, Barcelona, Spain  \nfilms also exist in microelectronics, optics, optoelectronics, information storage, photovoltaics, miniaturised electrochemical energy storage and conversion devices, and protective coatings in metallurgy and bio-implants.  \nDramatic differen","cbCaiaOGHSt9xvqD","https://ap.wps.com/l/cbCaiaOGHSt9xvqD","pdf",5220944,23,"English","# Abstract\n# Introduction\n## Thin films as model systems\n## Why XRD is important for thin-film characterization","[{\"question\":\"What is the main purpose of this Back-to-Basics XRD tutorial?\",\"answer\":\"To lower the barrier for researchers performing meaningful XRD analysis and to make the literature more accessible for more advanced XRD investigations.\"},{\"question\":\"Which XRD measurement types are highlighted as essential for thin-film characterization?\",\"answer\":\"The tutorial introduces five types: θ-2θ scans, grazing-incidence scans, rocking curves, pole figures, and azimuth (ϕ) scans.\"},{\"question\":\"What practical aspects are covered to help beginners run effective XRD measurements?\",\"answer\":\"It gives guidelines for selecting appropriate optics, mounting and aligning the sample, choosing scan conditions, and recommends how to present data.\"}]","Back-to-Basics tutorial: X-ray diffraction of thin films | PDF",1791853353,8]