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The material explains why wafer-test challenges and shrinking process windows demand robust, no-luck monitoring, using control charts as the core caution mechanism. It details how to create control charts (performance parameters, baseline stability, control limits, and documented response procedures) and emphasizes complementary PCS components such as document control, process change control, training management, and recurring reviews. Examples show learning over time, improved chart signals, and corrective actions during breakdowns in control.",{"@graph":14,"@context":73},[15,34,56],{"@type":16,"itemListElement":17},"BreadcrumbList",[18,23,27,31],{"item":19,"name":20,"@type":21,"position":22},"https://docshare.wps.com","Home","ListItem",1,{"item":24,"name":25,"@type":21,"position":26},"https://docshare.wps.com/template/","Template",2,{"item":28,"name":29,"@type":21,"position":30},"https://docshare.wps.com/template/presentations/","Presentations",3,{"item":32,"name":10,"@type":21,"position":33},"https://docshare.wps.com/template/achieving-low-risk-volume-manufacturing-on-leading-edge-technology-probecards-definition-and-methodology-for-implementing-a-process-control-system-ieee-sw-test-workshop/239714/",4,{"url":32,"name":10,"@type":35,"image":36,"author":41,"headline":10,"publisher":44,"fileFormat":47,"inLanguage":8,"description":12,"dateModified":48,"datePublished":49,"encodingFormat":47,"isAccessibleForFree":50,"interactionStatistic":51},"DigitalDocument",{"url":37,"@type":38,"width":39,"height":40},"https://docshare.wps.com/thumbnails/achieving-low-risk-volume-manufacturing-on-leading-edge-technology-probecards-definition-and-methodology-for-implementing-a-process-control-system-ieee-sw-test-workshop/239714.png","ImageObject",442,249,{"name":42,"@type":43},"Nguyễn Văn Học","Person",{"url":19,"name":45,"@type":46},"DocShare","Organization","application/pdf","2026-10-30","2026-09-11",true,{"@type":52,"interactionType":53,"userInteractionCount":55},"InteractionCounter",{"@type":54},"ViewAction",9,{"@type":57,"mainEntity":58},"FAQPage",[59,65,69],{"name":60,"@type":61,"acceptedAnswer":62},"Why is a process control system (PCS) necessary for leading-edge wafer test volume manufacturing?","Question",{"text":63,"@type":64},"Because wafer-test technology faces shrinking pitch, higher probe counts, changing current requirements, and tighter process windows where producing correct, efficient results becomes very difficult. The material frames robust PCS as a survival need beyond simple within-spec monitoring.","Answer",{"name":66,"@type":61,"acceptedAnswer":67},"How are control charts created in the PCS methodology?",{"text":68,"@type":64},"First define performance parameters and critical process parameters (CPPs), then study variation to set practical control limits. Next run a baseline process to confirm stability and capability, and document response procedures and train the workforce to act on signals.",{"name":70,"@type":61,"acceptedAnswer":71},"What other components are required besides control charts for PCS effectiveness?",{"text":72,"@type":64},"The presentation stresses that control charts only provide the caution light. To prevent predictable process health issues, the organization must also manage document control, process change control, training management, and regular reviews of control limit changes.","https://schema.org",{"og:url":32,"og:type":75,"og:title":10,"og:site_name":45,"og:description":12},"article",{"robots":77,"canonical":32},"index,follow",{"doc_id":79,"site_id":7},239714,1791715977,{"code":4,"msg":82,"data":83},"success",[84,88,93,98,103,108,113,118,123],{"id":85,"doc_module":22,"doc_module_name":25,"category_name":29,"show_sort_weight":86,"slug":87},11,90,"presentations",{"id":89,"doc_module":22,"doc_module_name":25,"category_name":90,"show_sort_weight":91,"slug":92},12,"Resumes",80,"resumes",{"id":94,"doc_module":22,"doc_module_name":25,"category_name":95,"show_sort_weight":96,"slug":97},14,"Invoices",70,"invoices",{"id":99,"doc_module":22,"doc_module_name":25,"category_name":100,"show_sort_weight":101,"slug":102},15,"Posters",60,"posters",{"id":104,"doc_module":22,"doc_module_name":25,"category_name":105,"show_sort_weight":106,"slug":107},16,"Social Media",50,"social-media",{"id":109,"doc_module":22,"doc_module_name":25,"category_name":110,"show_sort_weight":111,"slug":112},17,"Forms",40,"forms",{"id":114,"doc_module":22,"doc_module_name":25,"category_name":115,"show_sort_weight":116,"slug":117},18,"Letters",30,"letters",{"id":119,"doc_module":22,"doc_module_name":25,"category_name":120,"show_sort_weight":121,"slug":122},21,"Paper Templates",5,"papers-templates",{"id":124,"doc_module":22,"doc_module_name":25,"category_name":125,"show_sort_weight":4,"slug":126},158,"General","general-158",{"code":4,"msg":82,"data":128},{"doc_id":79,"user_id":129,"nickname":42,"user_avatar":130,"doc_module":22,"category_id":85,"category_name":29,"doc_title":10,"doc_description":12,"doc_content":131,"file_id":132,"file_url":133,"file_type":134,"file_size":135,"view_count":55,"is_deleted":4,"is_public":22,"is_downloadable":22,"audit_status":22,"page_count":136,"language":137,"language_code":8,"site_id":7,"html_lang":8,"table_of_contents":138,"faqs":139,"seo_title":140,"seo_description":12,"update_tm":141,"read_time":121},1374402739827,"https://ap-avatar.wpscdn.com/avatar/14000c97e7351f1a627?x-image-process=image/resize,m_fixed,w_180,h_180&k=1787885694763230660","June 12 to 15, 2011 San Diego, CA  \nAchieving Low‐Risk, Volume Manufacturing on Leading Edge Technology Probecards; Definition and Methodology for Implementing a Process Control System  \nDouglas A. Sottoway Anil Kaza  \nIntel STTD Wafer Test  \nThe Title  \n• Made the title so it sounds very important. Why? Because it is. But what is it?  \n• Here is the title to put in your mind...  \n– What is a process control system, why do I need it?  \n2  \nMotivation for PCS  \n• Wafer test technology challenges continuing  \n– Shrinking pitch, increasing array size/probe count, current carrying requirements  \npitch, increasing array  \ncarrying requirements  \n• Shrinking process window at test  \n– Performing test efficiently and producing correct results is very difficult l h h i ll !  \n– No onger have huge margins to allow test process to vary!  \n• A robust process control system is now a matter of SURVIVAL!  \n– In my opinion, if you’re not doing this already, you need to start now  \n– Within spec monitoring not enough  \n– 7 years go we needed PCS in sort  \n• Every couple months the yield department would find something wrong with tool at sort  \n• Control charts were put in place to detect issues, this was better but still too many issues  \n• Simple PCS charts not enough, need fab solution, entire system for good process control  \nJune  \n12 to  \n15, 2011  \nIEEE SW Test Workshop  \n3  \nThe Stoplight  \n• In the days of horses and buggies, the stoplight had only  red/green  \n– In 1920 William Potts realized the advent of automobiles required a better method, i.e ., a yellow caution signal  \n• Specifications (red/green only) not enough to ensure a robust  \noutput and expected results  \n• Now need yellow, proceed with caution (control charts)  \n– Something bad could happen unless good decision‐making utilized  \n• Control charts are the core of PCS  \nbad could happen unless good decision  \n4  \nHow to Create a Control Chart  \n1. Define Performance Parameters  \nUSL  \n– Contact resistance  \nLSL  \n– Find Critical Process Parameters (CPPs)  \n• probe length mean  \n2. Study variation and set control limits  \n– Control limits should be practical  \n5  \nHow to Create a Control Chart  \n3. Run baseline process  \n– Engineer identify special cause and fix  \n– Find out if process stable and capable  \n4. Response procedures documented and trained  \nUSL  \nUCL  \nTarget  \nLCL  \nLSL  \n– Empower workforce with correct tools  \nOf Note:  \n• Expect many signals during initial volume  \n– Engineering spends time responding to and learning about the signals  \n– Root cause fixes are put in place and response procedures are documented and trained  \n• The process gets healthier, control charts are improved  \n• The amount of learning and process improvement made simply from responding to  \ngood control charts is amazing, and I’ve been doing this for 21 years  \n6  \nWhat is a Process Control System?  \n• Control charts provide the caution light but...  \n– There are other critical components that the organization must have to make control charts fully effective  \n– Any weakness in the other PCS components will eventually lead to  \nprocess health issues  \nIf any piece is missing, predictable output becomes  \na matter of luck when i d ti ht  \nprocess windows are tight  \nControl Charts  \nDocument Control  \nProcess Change Control  \nTraining Management  \nReview  \nExample: During Development Worn  \nPart Signal Found  \nUSL  \nUCL  \n~~ ~~ 2 sigma  \nSignal Found  \n• Control chart:  \nf b l h  \n– Mean of probe length  \n– Limits set ~ 3 sigma k li i i  \nTarget  \n2 sigma LCL  \nLSL  \ns 1.3  \n• Learning:  \n• Cp  \nto spec limits  \n– Concern with worn part  \n– Implement quarterly PM  \n– Process step is stable and capable  \n8  \nExample: 1 Year Later  \n• Production team sees f l ( )  \nout o  \ncontrols (OOCs )  \n– Huge increase in volume  \nTarget  \nLCL  \nLSL  \n• 2 tools to 5 tools  \n– Conclude 3 added tools  \nrun a little different – Still within spec  \n– Increase lower control limit  \n9  \nExample: Breakdo","cbCailTDI5ardHXJ","https://ap.wps.com/l/cbCailTDI5ardHXJ","pdf",485762,13,"English","# Motivation for PCS\n# The Stoplight\n# How to Create a Control Chart\n## Define performance parameters\n## Study variation and set control limits\n## Run baseline process and establish response procedures\n# What is a Process Control System?\n## Control charts and supporting PCS components\n## Review and process change governance\n# Examples of PCS in action","[{\"question\":\"Why is a process control system (PCS) necessary for leading-edge wafer test volume manufacturing?\",\"answer\":\"Because wafer-test technology faces shrinking pitch, higher probe counts, changing current requirements, and tighter process windows where producing correct, efficient results becomes very difficult. The material frames robust PCS as a survival need beyond simple within-spec monitoring.\"},{\"question\":\"How are control charts created in the PCS methodology?\",\"answer\":\"First define performance parameters and critical process parameters (CPPs), then study variation to set practical control limits. Next run a baseline process to confirm stability and capability, and document response procedures and train the workforce to act on signals.\"},{\"question\":\"What other components are required besides control charts for PCS effectiveness?\",\"answer\":\"The presentation stresses that control charts only provide the caution light. To prevent predictable process health issues, the organization must also manage document control, process change control, training management, and regular reviews of control limit changes.\"}]","Achieving Low-Risk, Volume Manufacturing on Leading Edge Technology Probecards - Definition and Methodology for Implementing a Process Control System - IEEE SW Test Workshop | PDF",1789152328]