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The material contrasts current channel-oriented design-flow gaps with an eye-centric workflow that improves channel design time, increases robustness toward end-to-end channel performance, and reduces marginal-design risk. Core eye-diagram concepts are covered, including key measurements, statistical delay and jitter effects, eye binning, histogram-based analysis, delay calculation requirements for automation, and automated eye crossing detection using histogram 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Performance Centric High Speed Digital Design Flow  \nApril 23, 2009  \nEuropean IBIS Summit, Nice France  \nSaliou Dieye, Agilent Technologies,  \nEEsof EDA Product Line  \nEMEA Market Development Manager Brahim Bensalem, Intel Corporation  \nLihua Wang, Agilent Technologies, EEsof EDA Sanjeev Gupta, Agilent Technologies, EEsof EDA  \nPage 1  \nAgilent Technologies-EEsof EDA  \nAgenda  \n• Channel Complexity and Gaps in Current Design Flow  \n• Advantage of End to End Eye Centric Design Flow  \n• Why an Eye Diagram ?  \n• Eye Diagram Measurements  \n• Optimization of DDR2 Channel.  \nPage 2  \nAgilent Technologies-EEsof EDA  \nAdvantage of Eye Centric Design Flow  \n• Substantial gain in Channel Design Time (More than 3 weeks in our DDR2 case)  \n• Design is more robust since channel is optimized toward end to end channel performance  \n• Reduces risk of marginal design or opportunity loss due to over design  \nPage 4  \nAgilent Technologies-EEsof EDA  \nEye Diagram  \nWhy Eye Diagram is Important?  \nPage 5  \nAgilent Technologies-EEsof EDA  \nCharacterizing an Eye Diagram  \nMost commonly used eye diagram measurements  \n• Eye level 1 & level 0  \n• Eye rise/ fall time  \n• Eye opening  \n• Eye width  \n• Eye height  \n• Eye amplitude  \n• Peak to peak & RMS jitter  \nDelay Effect  \nMost of the measurements are statistical in nature  \nPage 6  \nAgilent Technologies-EEsof EDA  \nSlice and Dice  \nEye Binning  \nEye Diagram  \nBinning Data  \nPage 7  \nAgilent Technologies-EEsof EDA  \nHistogram Plots  \nHistogram can be created for any portion of eye diagram  \nHistogram across timing axis provide peak to peak jitter  \nHistogram across amplitude axis provide distribution around level one and zero  \nPage 8  \nAgilent Technologies-EEsof EDA  \nEye Delay  \nWhy delay calculation is required  \n• Delay calculation is required for automated eye parameter measurements  \n• Binning the eye diagram makes this calculation easy  \nCalculated Delay  \nPage 9  \nAgilent Technologies-EEsof EDA  \nAutomated Eye Crossing Detection  \n• Mean value of horizontal histogram provide crossing time value  \n• Mean value of amplitude histogram provides crossing amplitude value  \nPage 10  \nAgilent Technologies-EEsof EDA","cbCaihcfKZsgWFn0","https://ap.wps.com/l/cbCaihcfKZsgWFn0","pdf",682752,26,"English","# Agenda\n## Channel Complexity and Gaps in Current Design Flow\n## Advantage of End to End Eye Centric Design Flow\n## Why an Eye Diagram?\n## Eye Diagram Measurements\n## Optimization of DDR2 Channel.\n# Advantage of Eye Centric Design Flow\n## Channel Design Time Gain\n## End to End Robustness\n## Risk Reduction\n# Eye Diagram\n## Why Eye Diagram is Important\n## Characterizing an Eye Diagram\n## Most Common Eye Diagram Measurements\n# Slice and Dice\n## Eye Binning\n# Histogram Plots and Binning Data\n# Eye Delay\n## Why delay calculation is required\n## Calculated Delay\n# Automated Eye Crossing Detection","[{\"question\":\"What are the main gaps in the current design flow discussed in the agenda?\",\"answer\":\"The agenda highlights channel complexity and gaps in the current design flow as the motivation for changing the approach.\"},{\"question\":\"Why is an eye diagram important in this design flow?\",\"answer\":\"An eye diagram is used to evaluate and characterize channel behavior; the deck explains its importance and then details common eye-diagram measurements.\"},{\"question\":\"How does eye binning support automated eye parameter measurements?\",\"answer\":\"Eye delay calculation is required for automated eye parameter measurements, and the deck states that binning the eye diagram makes this calculation easier.\"}]","The use of Optimization in Signal Integrity Performance Centric High Speed Digital Design Flow - April 23, 2009 - European IBIS Summit | PDF",1792971302,66]