[{"data":1,"prerenderedAt":-1},["ShallowReactive",2],{"detail-sidebar-cat-0-en-105":3,"doc-seo-664150-105":59,"doc-detail-664150-en":130},{"code":4,"msg":5,"data":6},0,"success",[7,13,18,23,28,33,38,43,48,51,55],{"id":8,"doc_module":4,"doc_module_name":9,"category_name":10,"show_sort_weight":11,"slug":12},1,"Document","Story & Novel",90,"story-novel",{"id":14,"doc_module":4,"doc_module_name":9,"category_name":15,"show_sort_weight":16,"slug":17},2,"Literature",80,"literature",{"id":19,"doc_module":4,"doc_module_name":9,"category_name":20,"show_sort_weight":21,"slug":22},4,"Exam",70,"exam",{"id":24,"doc_module":4,"doc_module_name":9,"category_name":25,"show_sort_weight":26,"slug":27},5,"Comic",60,"comic",{"id":29,"doc_module":4,"doc_module_name":9,"category_name":30,"show_sort_weight":31,"slug":32},6,"Technology",50,"technology",{"id":34,"doc_module":4,"doc_module_name":9,"category_name":35,"show_sort_weight":36,"slug":37},7,"Healthcare",40,"healthcare",{"id":39,"doc_module":4,"doc_module_name":9,"category_name":40,"show_sort_weight":41,"slug":42},8,"Research & Report",30,"research-report",{"id":44,"doc_module":4,"doc_module_name":9,"category_name":45,"show_sort_weight":46,"slug":47},9,"Religion & Spirituality",20,"religion-spirituality",{"id":46,"doc_module":4,"doc_module_name":9,"category_name":49,"show_sort_weight":46,"slug":50},"World Cup","world-cup",{"id":52,"doc_module":4,"doc_module_name":9,"category_name":53,"show_sort_weight":52,"slug":54},10,"Lifestyle","lifestyle",{"id":56,"doc_module":4,"doc_module_name":9,"category_name":57,"show_sort_weight":24,"slug":58},19,"General","general",{"code":4,"msg":60,"data":61},"ok",{"site_id":62,"language":63,"slug":64,"title":65,"keywords":66,"description":67,"schema_data":68,"social_meta":123,"head_meta":125,"extra_data":127,"updated_unix":129},105,"en","surface-roughness-measurement-practical-tips-for-laboratory-and-workshop","Surface Roughness Measurement - Practical tips for laboratory and workshop","","Surface roughness measurement guidance focuses on practical laboratory and workshop procedures, including defining profiles through filtering methods and selecting roughness, waviness, and primary profile parameters. It explains how the measured profile is obtained by tracing with a probe and how filtering separates short-wave and long-wave components. The document covers key evaluation parameters such as Ra, Rz, Rt, RSm, and Rmr(c), preferred parameter choices by surface function, and measurement conditions referencing DIN EN ISO standards.",{"@graph":69,"@context":122},[70,84,105],{"@type":71,"itemListElement":72},"BreadcrumbList",[73,77,79,82],{"item":74,"name":75,"@type":76,"position":8},"https://docshare.wps.com","Home","ListItem",{"item":78,"name":9,"@type":76,"position":14},"https://docshare.wps.com/document/",{"item":80,"name":40,"@type":76,"position":81},"https://docshare.wps.com/document/research-report/",3,{"item":83,"name":65,"@type":76,"position":19},"https://docshare.wps.com/document/surface-roughness-measurement-practical-tips-for-laboratory-and-workshop/664150/",{"url":83,"name":65,"@type":85,"image":86,"author":91,"headline":65,"publisher":94,"fileFormat":97,"inLanguage":63,"description":67,"dateModified":98,"datePublished":99,"encodingFormat":97,"isAccessibleForFree":100,"interactionStatistic":101},"DigitalDocument",{"url":87,"@type":88,"width":89,"height":90},"https://docshare.wps.com/thumbnails/surface-roughness-measurement-practical-tips-for-laboratory-and-workshop/664150.png","ImageObject",300,407,{"name":92,"@type":93},"cryingin4k","Person",{"url":74,"name":95,"@type":96},"DocShare","Organization","application/pdf","2026-10-30","2026-10-29",true,{"@type":102,"interactionType":103,"userInteractionCount":81},"InteractionCounter",{"@type":104},"ViewAction",{"@type":106,"mainEntity":107},"FAQPage",[108,114,118],{"name":109,"@type":110,"acceptedAnswer":111},"How are the primary profile and roughness profile derived during measurement?","Question",{"text":112,"@type":113},"The primary profile is obtained by low-pass filtering the measuring values using the cutoff wavelength λs. The roughness profile is then obtained by high-pass filtering the primary profile using the cutoff wavelength λc, which removes long-wave parts.","Answer",{"name":115,"@type":110,"acceptedAnswer":116},"Which imperfections are excluded from being considered roughness?",{"text":117,"@type":113},"Cracks, scratches, and dents are not counted as roughness and should not be measured. If needed, tolerances should be determined according to the referenced standard.",{"name":119,"@type":110,"acceptedAnswer":120},"How should preferred roughness parameters be selected for different surface functions?",{"text":121,"@type":113},"Maximum surface roughness Rz1max is preferred for sealing or functional surfaces where individual deviations strongly affect performance. Material portion Rmr(c) is used for guide and sealing surfaces moving against each other, while surface roughness depth Rz is typically used for other surfaces; Ra is often of lower significance because it averages out peaks and valleys.","https://schema.org",{"og:url":83,"og:type":124,"og:title":65,"og:site_name":95,"og:description":67},"article",{"robots":126,"canonical":83},"index,follow",{"doc_id":128,"site_id":62},664150,1793241190,{"code":4,"msg":5,"data":131},{"doc_id":128,"user_id":132,"nickname":92,"user_avatar":133,"doc_module":4,"category_id":39,"category_name":40,"doc_title":65,"doc_description":67,"doc_content":134,"file_id":135,"file_url":136,"file_type":137,"file_size":138,"view_count":81,"is_deleted":4,"is_public":8,"is_downloadable":8,"audit_status":8,"page_count":39,"language":139,"language_code":63,"site_id":62,"html_lang":63,"table_of_contents":140,"faqs":141,"seo_title":142,"seo_description":67,"update_tm":129,"read_time":46},137458181193,"https://ap-avatar.wpscdn.com/davatar_6f874abed73319feea01a86fa6f0fab8","Form Measurement  \n~~ SURFACE ROUGHnESS   mEASUREmEnt ~~  \nBulletin No. 1984  \nPractical tips for laboratory and workshop  \n• Profiles and filters  \n• Roughness parameters  \n• Preferred parameters  \n• Measuring conditions  \n• Evaluation  \n• Drawing symbols  \n• Profiles and filters (DIN EN ISO 4287:1998 and DIN EN ISO 11562:1998) The actual surface profile results from the intersection of the actual part surface with a plane perpendicular to this surface. The plane should roughly be vertical to the machining grooves. The measured surface profile is the profile after tracing the actual surface profile using a probe. In doing so, the measured values are filtered through the effect of the stylus tip radius rtip and-where applicable-through the sliding skid of the probe system. Imperfections of the surface, like cracks, scratches and dents do not count as roughness and should not be measured. If necessary, tolerances must be determined for this according to DIN EN ISO 8785. The primary profile is the profile after low-pass filtering the measuring values using the cutoff wavelength λs. In doing so, the short-wave profile parts are cutoff. The parameters are identified by P and evaluated within the sampling length (cut-off) . This equals the measured length or the length of the measured surface profile.  \nFig. 1: Primary profile after λS low-pass filtering  \nThe roughness profile results from high-pass filtering the primary profile with the cutoff wavelength λc. In doing so, the long-wave profile parts are cut-off. The parameters are identified by R and evaluated over the measured length ln which is usually composed of five single measured lengths lr. The single measured length corresponds to the cutoff wavelength λc of the profile filter.  \nFig. 2: Roughness profile after λC high-pass filtering with center line representation according to EN ISO 4287  \nThe waviness profile results from low-pass filtering the primary profile with the cutoff wavelength λc and high-pass filtering with the cutoff wavelength λf. The parameters are identified by W and evaluated over the measured length In which is composed of several sampling lengths lw.The single measured length Iw corresponds to the cutoff wavelength λf of the high-pass filter. However, their number is not standardized and must therefore always be indicated on the drawing. It should range between five and ten. Profile filters λc (Fig. 3) and λf are applied successively. The waviness profile always results from application of both filters (Fig. 4) .  \nFig. 3: Representation after λc low-pass filtering  \nFig. 4: Waviness profile after λc low-pass filtering and λf high-pass filtering with center line representation according to EN ISO 4287  \nFig. 5: Transmission characteristics of the filters for the different profiles, Gaussian filter according to DIN EN ISO 11562:1998  \n• Roughness parameters (DIN EN ISO 4287:1998)  \nRa – Arithmetic mean surface roughness: Arithmetical mean of the sums of all profile values Rmr(c)– Material proportion of the profile: Quotient from the sum of all material lengths of the profile elements at the specified section height c (in µm) and the measured length ln (specified in per cent)  \nRSm – Average groove width: Mean value of the width of the profile elements Xsi (formerly Sm); for the evaluation, horizontal and vertical counting thresholds are determined. Rt – Total height of the roughness profile: Sum from the height Zp of the highest profile peak and the depth Zv of the lowest profile valley within the measured length ln Rzi – Maximum height of the roughness profile: Sum from the height of the highest profile peak and the depth of the lowest profile valley within a sampling length lri Rz1max – Maximum surface roughness: Largest of the five Rzi-values from the five sampling lengths lri over the total measured length ln  \nRz – Surface roughness depth: Mean value of the five Rzi-values from the five sampling lengths lri over the total measured length ln  \nFig.","cbCaimfjUD9YI5XX","https://ap.wps.com/l/cbCaimfjUD9YI5XX","pdf",5946813,"English","# Profiles and filters\n## Roughness parameters\n## Preferred parameters\n## Measuring conditions","[{\"question\":\"How are the primary profile and roughness profile derived during measurement?\",\"answer\":\"The primary profile is obtained by low-pass filtering the measuring values using the cutoff wavelength λs. The roughness profile is then obtained by high-pass filtering the primary profile using the cutoff wavelength λc, which removes long-wave parts.\"},{\"question\":\"Which imperfections are excluded from being considered roughness?\",\"answer\":\"Cracks, scratches, and dents are not counted as roughness and should not be measured. If needed, tolerances should be determined according to the referenced standard.\"},{\"question\":\"How should preferred roughness parameters be selected for different surface functions?\",\"answer\":\"Maximum surface roughness Rz1max is preferred for sealing or functional surfaces where individual deviations strongly affect performance. Material portion Rmr(c) is used for guide and sealing surfaces moving against each other, while surface roughness depth Rz is typically used for other surfaces; Ra is often of lower significance because it averages out peaks and valleys.\"}]","Surface Roughness Measurement - Practical tips for laboratory and workshop | PDF"]