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It distinguishes primary profiles from roughness profiles (high-pass filtering) and waviness profiles (combined filtering), defining evaluation lengths and cut-off wavelengths. It then summarizes key roughness parameters such as Ra, Rmr(c), RSm, Rt, Rz, and Rz1max, and provides setup guidance under EN ISO 4288 for non-periodic and periodic profile measurement conditions.",{"@graph":69,"@context":122},[70,84,105],{"@type":71,"itemListElement":72},"BreadcrumbList",[73,77,79,82],{"item":74,"name":75,"@type":76,"position":8},"https://docshare.wps.com","Home","ListItem",{"item":78,"name":9,"@type":76,"position":14},"https://docshare.wps.com/document/",{"item":80,"name":40,"@type":76,"position":81},"https://docshare.wps.com/document/research-report/",3,{"item":83,"name":65,"@type":76,"position":19},"https://docshare.wps.com/document/quick-guide-to-surface-roughness-measurement-reference-guide-for-laboratory-and-workshop/664151/",{"url":83,"name":65,"@type":85,"image":86,"author":91,"headline":65,"publisher":94,"fileFormat":97,"inLanguage":63,"description":67,"dateModified":98,"datePublished":99,"encodingFormat":97,"isAccessibleForFree":100,"interactionStatistic":101},"DigitalDocument",{"url":87,"@type":88,"width":89,"height":90},"https://docshare.wps.com/thumbnails/quick-guide-to-surface-roughness-measurement-reference-guide-for-laboratory-and-workshop/664151.png","ImageObject",300,407,{"name":92,"@type":93},"The weather in my hometown","Person",{"url":74,"name":95,"@type":96},"DocShare","Organization","application/pdf","2026-10-30","2026-10-29",true,{"@type":102,"interactionType":103,"userInteractionCount":19},"InteractionCounter",{"@type":104},"ViewAction",{"@type":106,"mainEntity":107},"FAQPage",[108,114,118],{"name":109,"@type":110,"acceptedAnswer":111},"What is the difference between the measured profile and the primary profile?","Question",{"text":112,"@type":113},"The measured profile is obtained by scanning the actual profile and mechanically filtering it due to probe tip radius and, if present, probe skid. The primary profile is then generated by electronic low-pass filtering of the measured profile using a cut-off wavelength λs.","Answer",{"name":115,"@type":110,"acceptedAnswer":116},"How are the roughness profile (R-profile) and waviness profile (W-profile) generated?",{"text":117,"@type":113},"The R-profile results from electronic high-pass filtering of the primary profile with a cut-off wavelength λc, removing longer wavelength components. The W-profile is created by low-pass filtering the primary profile with λc and then high-pass filtering with λf.",{"name":119,"@type":110,"acceptedAnswer":120},"Which roughness parameters are commonly used and what do they represent?",{"text":121,"@type":113},"Ra is the arithmetical mean roughness value based on absolute deviations from the roughness profile mean line. Rt is the total height between highest peak and deepest valley, Rz is the mean roughness depth from five Rzi values, and Rz1max is the maximum roughness depth from the five sampling lengths.","https://schema.org",{"og:url":83,"og:type":124,"og:title":65,"og:site_name":95,"og:description":67},"article",{"robots":126,"canonical":83},"index,follow",{"doc_id":128,"site_id":62},664151,1793241191,{"code":4,"msg":5,"data":131},{"doc_id":128,"user_id":132,"nickname":92,"user_avatar":133,"doc_module":4,"category_id":39,"category_name":40,"doc_title":65,"doc_description":67,"doc_content":134,"file_id":135,"file_url":136,"file_type":137,"file_size":138,"view_count":19,"is_deleted":4,"is_public":8,"is_downloadable":8,"audit_status":8,"page_count":39,"language":139,"language_code":63,"site_id":62,"html_lang":63,"table_of_contents":140,"faqs":141,"seo_title":142,"seo_description":67,"update_tm":129,"read_time":46},1374408744247,"https://ap-avatar.wpscdn.com/avatar/14001251d37d565ec6f?x-image-process=image/resize,m_fixed,w_180,h_180&k=1790672120290115972","Bulletin No. 2229  \nQUICK GUIDE TO SURFACE ROUGHNESS MEASUREMENT  \nReference guide for laboratory and workshop  \nSURFACE ROUGHNESS  \nSurface profiles and filters  \n(EN ISO 4287 and EN ISO 16610-21)  \nThe actual profile is the profile resulting from the intersection of the workpiece surface and a plane normal to that surface and in a direction that maximizes the surface roughness value, normally at right angles to the lay of the machining marks.  \nThe measured profile is the profile resulting from scanning the actual profile with a probe which mechanically filters this profile due to the probe tip radius rtip and, if fitted, by the skid of the probe system. Surface imperfections, such as cracks, scratches and dents are not part of the profile and should not be included in the recording. If necessary, tolerances according to DIN EN ISO 8785 can be set for them.  \nThe primary profile (P-profile) is the profile resulting from electronic low-pass filtering of the measured profile with a cut-off wavelength λs . This process removes the shortest wavelength components that are judged not relevant to a roughness measurement. The parameters are designated P and evaluated within the sampling lengths. In Figure 1 this is equal to the evaluation length In (the total length of the surface profile recorded) .  \n> Figure 1: The primary profile and mean line for the primary profile (λs cut-off) filter  \nThe roughness profile (R-profile) is the profile resulting from electronic highpass filtering of the primary profile with a cut-off wavelength λc . This process removes the longer wavelength components as shown in Figure 2. The parameters are designated R and evaluated within the evaluation length ln, which generally consists of five sampling lengths lr. The sampling length corresponds to the cut-off wavelength λc of the profile filter.  \n> Figure 2: The roughness profile with its mean line (high-pass filtering of the primary profile with a cut-off wavelength of λc)  \nThe waviness profile (W-profile) is the profile resulting from electronic low-pass filtering of the primary profile with the cut-off wavelength λc (Figure 3) followed  \nby high-pass filtering with the cut-off wavelength λf as shown in Figure 4. The parameters are designated W and evaluated over the evaluation length In, consisting of several sampling lengths lw. The sampling length Iw corresponds to the cut-off wavelength λf of the high-pass filter. However, this quantity is not standardized and must be stipulated on the drawing. It should lie between five and ten times λf.  \n> Figure 3: Low-pass filtered mean line from the primary profile and mean line for the λf profile filter  \n> Figure 4: Waviness profile with mean line after high-pass filtering with the λc profile filter  \n2  \nλs λc λf  \n> Figure 5: Transmission parameters of the filters used to separate roughness and waviness characteristics. Filter response is Gaussian according to DIN EN ISO 11562:1998  \nRoughness parameters  \n(EN ISO 4287)  \nRa – arithmetical mean roughness value: The arithmetical mean of the absolute values of the profile deviations (Zi) from the mean line of the roughness profile (Figure 6) .  \nRmr(c)– material component of the profile: The fraction of a line, which, in sectioning a profile, cuts through material at a stipulated height c above the mean line (in μm) . Stated as a percentage.  \nRSm – mean peak width: Mean value of the width of the profile elements Xsi (previously Sm); horizontal and vertical counting thresholds are stipulated for this evaluation (Figure 8) .  \nQuick Guide to Surface Roughness Measurement  \nRoughness parameters (cont.)  \n3  \nRt – total height of the roughness profile: Difference between height Zp of the highest peak and depth Zv of the deepest valley within the evaluation length ln (Figure 7) .  \nRzi – greatest height of the roughness profile: Sum of the height of the highest profile peak and the depth of the deepest profile valley, relative to the mean line, within a samp","cbCaicuu4uoz8yz4","https://ap.wps.com/l/cbCaicuu4uoz8yz4","pdf",1111504,"English","# QUICK GUIDE TO SURFACE ROUGHNESS MEASUREMENT\n## Surface profiles and filters (EN ISO 4287 and EN ISO 16610-21)\n## Roughness parameters (EN ISO 4287)\n## Preferred parameters\n## Setups for roughness measurement (EN ISO 4288)","[{\"question\":\"What is the difference between the measured profile and the primary profile?\",\"answer\":\"The measured profile is obtained by scanning the actual profile and mechanically filtering it due to probe tip radius and, if present, probe skid. The primary profile is then generated by electronic low-pass filtering of the measured profile using a cut-off wavelength λs.\"},{\"question\":\"How are the roughness profile (R-profile) and waviness profile (W-profile) generated?\",\"answer\":\"The R-profile results from electronic high-pass filtering of the primary profile with a cut-off wavelength λc, removing longer wavelength components. The W-profile is created by low-pass filtering the primary profile with λc and then high-pass filtering with λf.\"},{\"question\":\"Which roughness parameters are commonly used and what do they represent?\",\"answer\":\"Ra is the arithmetical mean roughness value based on absolute deviations from the roughness profile mean line. Rt is the total height between highest peak and deepest valley, Rz is the mean roughness depth from five Rzi values, and Rz1max is the maximum roughness depth from the five sampling lengths.\"}]","QUICK GUIDE TO SURFACE ROUGHNESS MEASUREMENT - Reference guide for laboratory and workshop | PDF"]