[{"data":1,"prerenderedAt":-1},["ShallowReactive",2],{"doc-seo-393957-105":3,"detail-sidebar-cat-0-en-105":81,"doc-detail-393957-en":130},{"code":4,"msg":5,"data":6},0,"ok",{"site_id":7,"language":8,"slug":9,"title":10,"keywords":11,"description":12,"schema_data":13,"social_meta":74,"head_meta":76,"extra_data":78,"updated_unix":80},105,"en","juliet-series-3-dynamic-mixed-signal-test-and-isp","JULIET Series 3 - Dynamic mixed-signal test and ISP","","JULIET Series 3 describes a dynamic mixed-signal test and ISP system for prototyping and production, covering detection of shorts and opens, evaluation of external interfaces, assembly programming, application functionality testing, and product calibration. It specifies functional tests for power-up, analogue voltage and digital sequence measurements, waveform generation, frequency measurement, and microprocessor access. The document details flash programming for internal and external memory, bad block handling, PLD/CPLD, serial numbers, and production and calibration data. It also lists tester software, high-speed interfaces, JTAG boundary scan standards, PCB and environment requirements.",{"@graph":14,"@context":73},[15,34,56],{"@type":16,"itemListElement":17},"BreadcrumbList",[18,23,27,31],{"item":19,"name":20,"@type":21,"position":22},"https://docshare.wps.com","Home","ListItem",1,{"item":24,"name":25,"@type":21,"position":26},"https://docshare.wps.com/document/","Document",2,{"item":28,"name":29,"@type":21,"position":30},"https://docshare.wps.com/document/technology/","Technology",3,{"item":32,"name":10,"@type":21,"position":33},"https://docshare.wps.com/document/juliet-series-3-dynamic-mixed-signal-test-and-isp/393957/",4,{"url":32,"name":10,"@type":35,"image":36,"author":41,"headline":10,"publisher":44,"fileFormat":47,"inLanguage":8,"description":12,"dateModified":48,"datePublished":49,"encodingFormat":47,"isAccessibleForFree":50,"interactionStatistic":51},"DigitalDocument",{"url":37,"@type":38,"width":39,"height":40},"https://docshare.wps.com/thumbnails/juliet-series-3-dynamic-mixed-signal-test-and-isp/393957.png","ImageObject",300,407,{"name":42,"@type":43},"Sarah ","Person",{"url":19,"name":45,"@type":46},"DocShare","Organization","application/pdf","2026-10-10","2026-09-26",true,{"@type":52,"interactionType":53,"userInteractionCount":55},"InteractionCounter",{"@type":54},"ViewAction",10,{"@type":57,"mainEntity":58},"FAQPage",[59,65,69],{"name":60,"@type":61,"acceptedAnswer":62},"What are the main functions performed by JULIET Series 3?","Question",{"text":63,"@type":64},"It supports detection of shorts and opens, evaluates external interfaces, programs the assembly, tests application functionality, and calibrates the product for prototyping and production.","Answer",{"name":66,"@type":61,"acceptedAnswer":67},"Which flash memories and programming features does the system support?",{"text":68,"@type":64},"It supports MCU internal Flash and external flash (NAND, NOR), including Bad Block Handling, PLD/CPLD, serial numbers, plus production data and calibration data.",{"name":70,"@type":61,"acceptedAnswer":71},"What embedded boundary-scan standards are listed?",{"text":72,"@type":64},"The document lists IEEE 1149.1 Boundary Scan, IEEE 1149.6 differential Boundary Scan, and IEEE 1149.8.1 selective toggle, along with interconnection/RAM/cluster test and several supported interfaces.","https://schema.org",{"og:url":32,"og:type":75,"og:title":10,"og:site_name":45,"og:description":12},"article",{"robots":77,"canonical":32},"index,follow",{"doc_id":79,"site_id":7},393957,1790931378,{"code":4,"msg":82,"data":83},"success",[84,88,92,96,101,105,110,115,120,123,126],{"id":22,"doc_module":4,"doc_module_name":25,"category_name":85,"show_sort_weight":86,"slug":87},"Story & Novel",90,"story-novel",{"id":26,"doc_module":4,"doc_module_name":25,"category_name":89,"show_sort_weight":90,"slug":91},"Literature",80,"literature",{"id":33,"doc_module":4,"doc_module_name":25,"category_name":93,"show_sort_weight":94,"slug":95},"Exam",70,"exam",{"id":97,"doc_module":4,"doc_module_name":25,"category_name":98,"show_sort_weight":99,"slug":100},5,"Comic",60,"comic",{"id":102,"doc_module":4,"doc_module_name":25,"category_name":29,"show_sort_weight":103,"slug":104},6,50,"technology",{"id":106,"doc_module":4,"doc_module_name":25,"category_name":107,"show_sort_weight":108,"slug":109},7,"Healthcare",40,"healthcare",{"id":111,"doc_module":4,"doc_module_name":25,"category_name":112,"show_sort_weight":113,"slug":114},8,"Research & Report",30,"research-report",{"id":116,"doc_module":4,"doc_module_name":25,"category_name":117,"show_sort_weight":118,"slug":119},9,"Religion & Spirituality",20,"religion-spirituality",{"id":118,"doc_module":4,"doc_module_name":25,"category_name":121,"show_sort_weight":118,"slug":122},"World Cup","world-cup",{"id":55,"doc_module":4,"doc_module_name":25,"category_name":124,"show_sort_weight":55,"slug":125},"Lifestyle","lifestyle",{"id":127,"doc_module":4,"doc_module_name":25,"category_name":128,"show_sort_weight":97,"slug":129},19,"General","general",{"code":4,"msg":82,"data":131},{"doc_id":79,"user_id":132,"nickname":42,"user_avatar":133,"doc_module":4,"category_id":102,"category_name":29,"doc_title":10,"doc_description":12,"doc_content":134,"file_id":135,"file_url":136,"file_type":137,"file_size":138,"view_count":55,"is_deleted":4,"is_public":22,"is_downloadable":22,"audit_status":22,"page_count":26,"language":139,"language_code":8,"site_id":7,"html_lang":8,"table_of_contents":140,"faqs":141,"seo_title":142,"seo_description":12,"update_tm":143,"read_time":97},962085320529,"https://ap-avatar.wpscdn.com/davatar_9964176cb1d06d4a9deccf72a44ae3dc","JULIET Series 3  \nDynamic mixed-signal test and ISP for prototyping and production  \n· detecting shorts and opens  \n· evaluating external interfaces  \n· programming the assembly  \n· testing of application functionality  \n· calibrating the product  \nTechnical specifications  \nFunctional test  \n· discharge & power up  \n· drive & measure analogue voltages  \n· drive & measure digital sequences  \n· waveform generator & frequency measurement  \n· functional access to micro processors  \nFlash programming  \n· MCU internal Flash  \n· external flash (NAND, NOR)  \n· Bad Block Handling  \n· PLD/CPLD  \n· serial numbers  \n· production data  \n· calibration data  \nSoftware  \n· Tester Link Software (TLS)  \n· online PASS/FAIL statistics  \n· SYSTEM CASCON™  \n· optional MES interface  \nTester interface  \n· 4 power supplies (internal/external)  \n· 4 test access ports (TAPs) at up to  \n100 MHz  \n· 192 hybrid I/O channels (A/D)  \n· 32 multi purpose ports (MPP)  \n· 16 differential channels  \n· 8/8 electrical isolated I/O channels  \n· 32 analogue measuring channels  \n· 16 analogue output channels  \n· 8 interfaces for RS232  \n· 4 interfaces for RS485  \nMechanics  \n· compact, portable desktop device  \n· industrial mechanics for manual loading and unloading  \n· changeable bed of nail fixtures  \n· LED display of all test results  \n· operation via control panel during production  \n· front interface for convenient signal measuring  \nEmbedded JTAG  \n· IEEE 1149.1-Boundary Scan  \n· IEEE 1149.6-differential Boundary Scan  \n· IEEE 1149.8.1-selective toggle  \n· interconnection/RAM/cluster test  \n· JTAG, SWD, BDM, SBW, PIC1x  \n· VarioTAP®, ChipVORX®, VarioCore  \nPCB requirements  \n· max. board dimensions: 340 mm x 230 mm  \n· both side contacting down to 50 mil  \n· max. count of nails: 600 (1 N)  \nEnvironment  \n· electrical connection: 100-240 VAC, 50-60 Hz, max. 350 W  \n· dimensions:  \n630 mm (W) x 550 mm (D) x 345 mm (H)  \n· weight: approx. 30 kg  \n· environment temperature: 10-35 °C  \nGÖPEL electronic GmbH  \n Goeschwitzer Str. 58/60 07745 Jena · Germany  \n [www.goepel.com](www.goepel.com)  \n Germany [ejs.sales@goepel.com](ejs.sales@goepel.com)  +49 3641 · 6896 0  \nInternational [int.ejs.sales@goepel.com](int.ejs.sales@goepel.com)  +49 3641 · 6896 944  \nIndia [ejs.sales@goepel.in](ejs.sales@goepel.in)  \nUSA [ejs.sales@goepelusa.com](ejs.sales@goepelusa.com)  ISO 9001, ISO 14001 certified  \nJULIET Series 3 en/11-2025 JULIULIET Seeri s 3-Dy aa ic mixd-s gnigna l test and ISP for p to p nr to p nty i g and p c oduc oti n","cbCaijVQMuyack9U","https://ap.wps.com/l/cbCaijVQMuyack9U","pdf",858085,"English","# Functional test\n## Discharge & power up\n## Drive & measure analogue voltages\n## Drive & measure digital sequences\n## Waveform generator & frequency measurement\n## Functional access to micro processors\n\n# Flash programming\n## MCU internal Flash\n## External flash (NAND, NOR)\n## Bad Block Handling\n## PLD/CPLD\n## Serial numbers and production data\n## Calibration data\n\n# Software and interfaces\n## Tester Link Software (TLS)\n## Online PASS/FAIL statistics\n## SYSTEM CASCON™\n## Optional MES interface\n## Tester interface and I/O ports\n\n# Mechanics, embedded JTAG, and requirements\n## Mechanics\n## Embedded JTAG\n## PCB requirements\n## Environment requirements","[{\"question\":\"What are the main functions performed by JULIET Series 3?\",\"answer\":\"It supports detection of shorts and opens, evaluates external interfaces, programs the assembly, tests application functionality, and calibrates the product for prototyping and production.\"},{\"question\":\"Which flash memories and programming features does the system support?\",\"answer\":\"It supports MCU internal Flash and external flash (NAND, NOR), including Bad Block Handling, PLD/CPLD, serial numbers, plus production data and calibration data.\"},{\"question\":\"What embedded boundary-scan standards are listed?\",\"answer\":\"The document lists IEEE 1149.1 Boundary Scan, IEEE 1149.6 differential Boundary Scan, and IEEE 1149.8.1 selective toggle, along with interconnection/RAM/cluster test and several supported interfaces.\"}]","JULIET Series 3 - Dynamic mixed-signal test and ISP | PDF",1790396708]