[{"data":1,"prerenderedAt":-1},["ShallowReactive",2],{"doc-detail-227949-en":3,"doc-seo-227949-105":30,"detail-sidebar-cat-0-en-105":97},{"code":4,"msg":5,"data":6},0,"success",{"doc_id":7,"user_id":8,"nickname":9,"user_avatar":10,"doc_module":4,"category_id":11,"category_name":12,"doc_title":13,"doc_description":14,"doc_content":15,"file_id":16,"file_url":17,"file_type":18,"file_size":19,"view_count":20,"is_deleted":4,"is_public":20,"is_downloadable":20,"audit_status":20,"page_count":21,"language":22,"language_code":23,"site_id":24,"html_lang":23,"table_of_contents":25,"faqs":26,"seo_title":27,"seo_description":14,"update_tm":28,"read_time":29},227949,8796096645457,"Arica Lee","https://ap-avatar.wpscdn.com/avatar/800003749518d68ffe3?x-image-process=image/resize,m_fixed,w_180,h_180&k=1779345340919836971",8,"Research & Report","Extended Temperature Operation of Isolated, Precision Gate Driver, ADuM4120 - Technical Memorandum","This technical memorandum evaluates the performance of an isolated, precision gate driver for controlling power-level transistors under extreme temperatures and thermal cycling. Electronics in space missions face severe thermal exposure and wide thermal swings, and most commercial off-the-shelf devices lack sufficient validated data outside rated conditions. Extending reliable operating range can improve reliability, reduce mass and weight, and simplify thermal design by reducing thermal control elements. The study assesses suitability for space exploration missions under harsh thermal conditions using an ADuM4120 gate driver.","NASA/TM-20230005367  \nExtended Temperature Operation of Isolated, Precision Gate Driver, ADuM4120  \nKristen Boomer  \nGlenn Research Center, Cleveland, Ohio  \nChristopher Tiu  \nGoddard Space Flight Center, Greenbelt, Maryland  \nAhmad Hammoud  \nHX5, LLC, Brook Park, Ohio  \nNASA STI Program . . . in Profile  \nSince its founding, NASA has been dedicated  \nto the advancement of aeronautics and space science. The NASA Scientific and Technical Information (STI) Program plays a key part in helping NASA maintain this important role.  \nThe NASA STI Program operates under the auspices of the Agency Chief Information Officer. It collects, organizes, provides for archiving, and disseminates NASA’s STI. The NASA STI Program provides access to the NASA Technical Report Server—Registered (NTRS Reg) and NASA Technical Report Server—Public (NTRS) thus providing one of the largest collections of aeronautical and space science STI in the world. Results are published in both non-NASA channels and by NASAin the NASA STI Report Series, which includes the following report types:  \n• TECHNICAL PUBLICATION. Reports of completed research or a major significant phase of research that present the results of NASA programs and include extensive data or theoretical analysis. Includes compilations of significantscientific and technical data and information deemed to be of continuing reference value. NASA counter-part of peer-reviewed formal professional papers, but has less stringent limitations on manuscript length and extent of graphic presentations.  \n• TECHNICAL MEMORANDUM. Scientificand technical findings that are preliminary or of specialized interest, e.g.,“quick-release” reports, working papers, and bibliographies that contain minimal annotation. Does not contain extensive  \nanalysis.  \n• CONTRACTOR REPORT. Scientific and technical findings by NASA-sponsored contractors and grantees.  \n• CONFERENCE PUBLICATION. Collected papers from scientific and technical conferences, symposia, seminars, or other meetings sponsored or co-sponsored by NASA.  \n• SPECIAL PUBLICATION. Scientific, technical, or historical information from NASA programs, projects, and missions, often concerned with subjects having substantial public interest.  \n• TECHNICAL TRANSLATION. Englishlanguage translations of foreign scientific and technical material pertinent to NASA’s mission.  \nFor more information about the NASA STI program, see the following:  \n• Access the NASA STI program home page at [http://www.sti.nasa.gov](http://www.sti.nasa.gov)  \n• [E-mail your question to help@sti.nasa.gov](E-mail your question to help@sti.nasa.gov)  \n• Fax your question to the NASA STI Information Desk at 757-864-6500  \n• Telephone the NASA STI Information Desk at 757-864-9658  \n• Write to:  \nNASA STI Program  \nMail Stop 148  \nNASA Langley Research Center  \nHampton, VA 23681-2199  \nNASA/TM-20230005367  \nExtended Temperature Operation of Isolated, Precision Gate Driver, ADuM4120  \nKristen Boomer  \nGlenn Research Center, Cleveland, Ohio  \nChristopher Tiu  \nGoddard Space Flight Center, Greenbelt, Maryland  \nAhmad Hammoud  \nHX5, LLC, Brook Park, Ohio  \nNational Aeronautics and Space Administration  \nGlenn Research Center Cleveland, Ohio 44135  \nAcknowledgments  \nThis work was performed at the NASA Glenn Research Center under GEARS Contract 80GRC020D0003. Funding was provided from the NASA Electronic Parts and Packaging (NEPP) Program Task “Wide Bandgap Reliability and Application Guidelines.”  \nTrade names and trademarks are used in this report for identification only. Their usage does not constitute an official endorsement, either expressed or implied, by the National Aeronautics and Space Administration.  \nLevel of Review: This material has been technically reviewed by technical management.  \nThis report is available in electronic form at [https://www.sti.nasa.gov/](https://www.sti.nasa.gov/ and)[ and](https://www.sti.nasa.gov/ and) [https://ntrs.nasa.gov/](https://ntrs.nasa.gov/)  \nExtended Temperature Operation of ","cbCaibsaD5418CeK","https://ap.wps.com/l/cbCaibsaD5418CeK","pdf",3146605,1,16,"English","en",105,"# Scope\n## Test Procedure","[{\"question\":\"What problem does the work address for space electronics?\",\"answer\":\"The work addresses the lack of data and reliability for commercial electronics when exposed to extreme temperatures and wide thermal swings in space missions.\"},{\"question\":\"What device is evaluated in this study?\",\"answer\":\"The study evaluates an isolated, precision single-channel gate driver based on the ADuM4120.\"},{\"question\":\"What performance conditions are tested?\",\"answer\":\"Performance is evaluated under extreme temperatures and thermal cycling to judge reliable operation beyond specified ranges.\"}]","Extended Temperature Operation of Isolated, Precision Gate Driver, ADuM4120 - 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